• DocumentCode
    2883748
  • Title

    A new Self-Aligned Asymmetric Structure (SAAS) for 0.1 μm MOSFET technology

  • Author

    Choi, Chang-Soon ; Kim, Kyung-Whan ; Choi, Woo-Young

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Yonsei Univ., Seoul, South Korea
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    60
  • Lastpage
    63
  • Abstract
    A new Self-Aligned Asymmetric Structure (SAAS) which has asymmetric halo at the highly doped source extension is proposed and optimized for sub-0.1 μm MOSFET technology. The fabrication process for the asymmetric structure requires no additional masks. The hydrodynamic device simulation coupled with process simulation shows that the highly doped asymmetric halo enhances the velocity overshoot at the source side and suppresses the short channel effects. The degradation of device performance caused by increased resistance in the highly doped halo is reduced by the asymmetric drain structure with low parasitic resistance
  • Keywords
    MOSFET; 0.1 micron; MOSFET; fabrication technology; highly doped asymmetric halo; hydrodynamic device simulation; parasitic resistance; process simulation; self-aligned asymmetric structure; short channel effect; velocity overshoot; Degradation; Doping; Dry etching; Fabrication; Hot carrier effects; Hot carriers; Hydrodynamics; Immune system; MOSFET circuits; Silicon devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2000. Proceedings. 2000 IEEE Hong Kong
  • Conference_Location
    Hong Kong
  • Print_ISBN
    0-7803-6304-3
  • Type

    conf

  • DOI
    10.1109/HKEDM.2000.904216
  • Filename
    904216