DocumentCode :
2883748
Title :
A new Self-Aligned Asymmetric Structure (SAAS) for 0.1 μm MOSFET technology
Author :
Choi, Chang-Soon ; Kim, Kyung-Whan ; Choi, Woo-Young
Author_Institution :
Dept. of Electr. & Comput. Eng., Yonsei Univ., Seoul, South Korea
fYear :
2000
fDate :
2000
Firstpage :
60
Lastpage :
63
Abstract :
A new Self-Aligned Asymmetric Structure (SAAS) which has asymmetric halo at the highly doped source extension is proposed and optimized for sub-0.1 μm MOSFET technology. The fabrication process for the asymmetric structure requires no additional masks. The hydrodynamic device simulation coupled with process simulation shows that the highly doped asymmetric halo enhances the velocity overshoot at the source side and suppresses the short channel effects. The degradation of device performance caused by increased resistance in the highly doped halo is reduced by the asymmetric drain structure with low parasitic resistance
Keywords :
MOSFET; 0.1 micron; MOSFET; fabrication technology; highly doped asymmetric halo; hydrodynamic device simulation; parasitic resistance; process simulation; self-aligned asymmetric structure; short channel effect; velocity overshoot; Degradation; Doping; Dry etching; Fabrication; Hot carrier effects; Hot carriers; Hydrodynamics; Immune system; MOSFET circuits; Silicon devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2000. Proceedings. 2000 IEEE Hong Kong
Conference_Location :
Hong Kong
Print_ISBN :
0-7803-6304-3
Type :
conf
DOI :
10.1109/HKEDM.2000.904216
Filename :
904216
Link To Document :
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