Title :
Application of the DVM method for transference of resistance values
Author :
Zorzano, R. ; de Aguilar, J. Diaz
Author_Institution :
Electr. Stand. Lab., INTA, Spain
Abstract :
Great difficulties arise with the application of the resistance standard based on the Hall effect (QHR). Any Hall-effect-based device has to be previously characterised in order to assess its correct performance. This characterisation must be done by a National Institute, provided with the adequate measurement systems and degree of expertise. Such measurement systems are excessively complex and expensive for the industry. To overcome this problem, M.E. Cage et al. (1991) investigated the use of high precision multimeters for measurement of the quantum Hall effect. In this paper the application of this system at the DC and LF Standards Laboratory of INTA is presented as a transfer method for the 10 kΩ reference standard to other laboratories
Keywords :
quantum Hall effect; 10 kohm; DVM method; QHE resistance standard; calibration; high precision multimeters; repeatability; transfer standard; transference of resistance values; uncertainties;
Conference_Titel :
Measurement Dissemination by Transfer Methods (Ref. No. 1999/048), IEE Seminar
Conference_Location :
London
DOI :
10.1049/ic:19990247