• DocumentCode
    288436
  • Title

    Performance evaluation of a novel fault tolerance training algorithm

  • Author

    Elsimary, Hamed ; Darwish, Ahmed ; Mashali, Samia ; Shaheen, Samir

  • Author_Institution
    Electron. Res. Inst., Cairo, Egypt
  • Volume
    2
  • fYear
    1994
  • fDate
    27 Jun-2 Jul 1994
  • Firstpage
    856
  • Abstract
    This paper presents a performance evaluation of a novel algorithm for fault tolerance training of artificial neural networks (ANNs). The proposed algorithm is based on a genetic algorithms technique. A realistic, and practical fault model is adopted, it reflects the failures that arise during hardware realization of ANNs, regardless of the hardware platform used in the implementation. Using this fault model, an algorithm is developed and experimental results are performed to test the validity of the algorithm for different feedforward network sizes and types, and to check the ability of the algorithm to cover other fault models as a subset of the adopted one. A comparison with the conventional backpropagation learning algorithm is performed. The results show that the proposed algorithm is superior to the backpropagation from the fault tolerance point of view. The proposed algorithm has potential benefits in designing ANNs that can tolerate internal faults in the hardware realization of ANNs by incorporating fault tolerance in the training phase
  • Keywords
    feedforward neural nets; genetic algorithms; learning (artificial intelligence); artificial neural networks; backpropagation learning algorithm; fault tolerance training algorithm; feedforward network; genetic algorithms; hardware realization; performance evaluation; Algorithm design and analysis; Artificial neural networks; Fault tolerance; Fault tolerant systems; Feeds; Genetic algorithms; Hardware; Performance evaluation; Redundancy; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-1901-X
  • Type

    conf

  • DOI
    10.1109/ICNN.1994.374292
  • Filename
    374292