Title :
73ps si bipolar ECL circuits
Author :
Tang, Dong ; Guann-Pyng Li ; Ching-Te Chuang ; Danner, Daniel ; Ketchen, M. ; Mauer, J. ; Smyth, M. ; Manny, M. ; Cressler, John ; Ginsberg, B. ; Petrillo, E. ; Tak Ning ; Chih-Chun Hu ; Haksong Pak
Author_Institution :
IBM Research Center, Yorktown Heights, NY, USA
Keywords :
Bipolar transistors; Delay; Electric breakdown; Electrodes; Isolation technology; Logic circuits; Resistors; Ring oscillators; Silicon; Testing;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1986 IEEE International
Conference_Location :
Anaheim, CA, USA
DOI :
10.1109/ISSCC.1986.1156926
