Sakurai, T. ; Sawada, K. ; Nogami, K. ; Wada, T. ; Isobe, M. ; Kakumu, M. ; Morita, S. ; Yokogawa, S. ; Kinugawa, M. ; Asami, T. ; Hashimoto, K. ; Matsunaga, J. ; Nozawa, H. ; Iizuka, Tetsuya
Author_Institution :
Toshiba Semiconductor Engineering Laboratory, Kawasaki, Japan
Volume :
XXIX
fYear :
1986
fDate :
19-21 Feb. 1986
Firstpage :
252
Lastpage :
253
Keywords :
Artificial intelligence; CMOS technology; Decoding; Electronics packaging; Fuses; Indium tin oxide; Memory architecture; Random access memory; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1986 IEEE International
