DocumentCode
288470
Title
Effect of synaptic failure on the performance of sparsely encoded Hopfield associative memory
Author
Shirazi, Mahdad N. ; Maekawa, Sadao
Author_Institution
Auditory & Visual Inf. Section, Commun. Res. Lab., Kobe, Japan
Volume
2
fYear
1994
fDate
27 Jun-2 Jul 1994
Firstpage
1050
Abstract
This paper investigates the fault-tolerance characteristic of sparsely encoded Hopfield associative memory with respect to synaptic disconnection. The effect of this fault on the network performance is evaluated in terms of capacity degradation. The optimum neuron´s threshold turns out to be depend on the failure-ratio β. Failure-ratio being an unknown, threshold is set to its optimum value corresponding to the case β=0. It then turns out that faulty-network is unable to store and retrieve patterns for at least β⩾1/2. Next, assuming that there exists an adaptive mechanism which estimates failure ratio and resets the threshold to its optimum value, it will be shown that network fault-tolerance is improved; network keeps its associative recall functionality for whole range of synaptic disconnectivity, showing only a graceful performance degradation. This degradation appears to be dependent on the sparsity of stored patterns
Keywords
Hopfield neural nets; content-addressable storage; fault tolerant computing; associative recall functionality; failure-ratio; fault-tolerance; graceful performance degradation; sparsely encoded Hopfield associative memory; synaptic disconnection; synaptic disconnectivity; synaptic failure; Associative memory; Biological neural networks; Degradation; Encoding; Fault tolerance; Fault tolerant systems; Informatics; Instruments; Neurons; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location
Orlando, FL
Print_ISBN
0-7803-1901-X
Type
conf
DOI
10.1109/ICNN.1994.374328
Filename
374328
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