Title :
A 4ns access time 4K × 4 ECL RAM
Author :
Arimura, M. ; Nakame, M. ; Tashiro, T. ; Ohi, S. ; Kamiya, T. ; Kishi, S. ; Minato, Y. ; Nokubo, J. ; Tamura, T.
Author_Institution :
NEC Corporation, Kanagawa, Japan
Keywords :
Capacitance; Carbon capture and storage; Conductivity; Cutoff frequency; Electric resistance; Epitaxial layers; Power dissipation; Read-write memory; Resistors; Space vector pulse width modulation;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1986 IEEE International
Conference_Location :
Anaheim, CA, USA
DOI :
10.1109/ISSCC.1986.1156940
