DocumentCode
2884769
Title
Impedance spectroscopy analysis of In2 O3 thin film gas sensor
Author
Mariappan, C.R. ; Prabhu, E. ; Gnanasekar, K.I. ; Jayaraman, V. ; Gnanasekaran, T.
Author_Institution
Liquid Metals and Structural Chemistry Division, Chemistry Group, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603 102, INDIA
fYear
2012
fDate
7-10 March 2012
Firstpage
200
Lastpage
203
Abstract
In2 O3 thin film was fabricated using pulsed laser deposition technique. The structure and morphology of the thin film were characterized by X-ray diffraction and atomic force microscopy respectively. AC impedance of In2 O3 thin film gas sensor were investigated at different temperatures (275 – 425 °C) when exposed into clean air and air containing NOx . Significant NOx sensing characteristics of thin film were observed at 325 °C by ac impedance analysis. The resistance and capacitance of indium oxide film were increased in the presence of NOx . The mechanism for the increase of resistance and of capacitance is presented.
Keywords
In2 O3 thin film; gas sensor; impedance spectroscopy; selectivity; space charge layer;
fLanguage
English
Publisher
ieee
Conference_Titel
Physics and Technology of Sensors (ISPTS), 2012 1st International Symposium on
Conference_Location
Pune, India
Print_ISBN
978-1-4673-1040-6
Type
conf
DOI
10.1109/ISPTS.2012.6260922
Filename
6260922
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