Title :
Subdiffraction focusing of scanning beams by combined nonlinear and negative-refraction layers
Author :
Husakou, A. ; Herrmann, J.
Author_Institution :
Max Born Inst. for Nonlinear Opt. & Short Pulse Spectrosc., Berlin
Abstract :
The possibility to focus a light beam below the diffraction limit, using a Kerr-type nonlinear medium to create seed evanescent components, and a photonic crystal with negative refraction to amplify them, is theoretically predicted.
Keywords :
optical Kerr effect; photonic crystals; Kerr type nonlinear medium; negative refraction layers; nonlinear refraction layers; photonic crystal; scanning beams; seed evanescent components; subdiffraction focusing; Crystalline materials; Focusing; Nonlinear optical devices; Nonlinear optics; Optical devices; Optical diffraction; Optical refraction; Photonic crystals; Refractive index; Slabs; (070.2580) Fourier optics; (220.2560) Focus;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
Electronic_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4629067
