Load-pull measurements using characterised matching network and variable load [UHF bipolar transistors]

Author

Chan, Wing-Shing ; Fan, Chi-Wing ; Yip, Peter C L

Author_Institution

Dept. of Electron. Eng., City Polytech. of Hong Kong, Kowloon, Hong Kong

fYear

1991

fDate

16-17 Jun 1991

Firstpage

388

Abstract

Load-pull measurements are traditionally performed using stub tuners which can be unreliable and difficult to use. The authors present a method which minimises the use of stub tuners, and by using characterised components reduces the measurement time considerably

Keywords

bipolar transistors; microwave measurement; power transistors; semiconductor device testing; solid-state microwave devices; UHF bipolar transistors; characterised matching network; load pull measurement; power transistors; stub tuners; variable load; Digital control; Frequency measurement; Impedance measurement; Manufacturing; Measurement techniques; Phase shifters; Power generation; Power measurement; Tuners; UHF measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on

Conference_Location

Shenzhen

Type

conf

DOI

10.1109/CICCAS.1991.184369

Filename

184369

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2885374