• DocumentCode
    2885784
  • Title

    Near-field intensity statistics in semicontinuous metal - dielectric films

  • Author

    Seal, Krishanu ; Noh, Hoondong ; Cao, Haichuan ; Genov, D.A. ; Sarychev, A.K. ; Shalaev, V. M. ; Ying, Z. C.

  • Author_Institution
    Department of Physics and Astronomy, Northwestern University, Evanston, IL 60208, USA
  • fYear
    2006
  • fDate
    21-26 May 2006
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Statistics obtained from the near-field of metal - dielectric films of varying metal concentration indicate the presence of delocalized states at the percolation threshold.
  • Keywords
    Dielectric films; Metals; Thin films; (160.3900) Metals; (180.5810) Scanning microscopy; (240.0310) Thin films; (240.5420) Polaritons; (240.6680) Surface plasmons; (240.6690) Surface waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
  • Conference_Location
    Long Beach, CA
  • Print_ISBN
    978-1-55752-813-1
  • Type

    conf

  • DOI
    10.1109/CLEO.2006.4629106
  • Filename
    4629106
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2885784