Title :
Near-field intensity statistics in semicontinuous metal - dielectric films
Author :
Seal, Krishanu ; Noh, Hoondong ; Cao, Haichuan ; Genov, D.A. ; Sarychev, A.K. ; Shalaev, V. M. ; Ying, Z. C.
Author_Institution :
Department of Physics and Astronomy, Northwestern University, Evanston, IL 60208, USA
Abstract :
Statistics obtained from the near-field of metal - dielectric films of varying metal concentration indicate the presence of delocalized states at the percolation threshold.
Keywords :
Dielectric films; Metals; Thin films; (160.3900) Metals; (180.5810) Scanning microscopy; (240.0310) Thin films; (240.5420) Polaritons; (240.6680) Surface plasmons; (240.6690) Surface waves;
Conference_Titel :
Lasers and Electro-Optics, 2006 and 2006 Quantum Electronics and Laser Science Conference. CLEO/QELS 2006. Conference on
Conference_Location :
Long Beach, CA
Print_ISBN :
978-1-55752-813-1
DOI :
10.1109/CLEO.2006.4629106
