Title :
Modeling power-supply disturbances in digital circuit
Author :
Cortes, Meritxell ; McCluskey, E. ; Wagner, Karl ; Lu, Dan
Author_Institution :
Stanford University, Stanford, CA, USA
Abstract :
A model that represents errors caused by power supply disturbances as delay faults will be discussed. Experiments reveal that the error susceptibility increases at high clock rates and that metastable states may result.
Keywords :
CMOS logic circuits; Circuit testing; Detectors; Digital circuits; Frequency; Logic circuits; Power supplies; Propagation delay; Semiconductor device modeling; Voltage;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1986 IEEE International
Conference_Location :
Anaheim, CA, USA
DOI :
10.1109/ISSCC.1986.1157008
