DocumentCode
2885887
Title
A method of test generation for large combinational circuits using input vector in pairs
Author
Mingjian, Liu ; Jiehua, Peng
Author_Institution
Guangdong Inst. of Technol., China
fYear
1991
fDate
16-17 Jun 1991
Firstpage
508
Abstract
The authors investigate a new method of test generation for large combinational circuits using input vectors in pairs. The forming rules of the best test codes are derived and analysed. The cut theorem and cut test generation are studied. The experiment results are completely in accordance with the theory. This proves that the test generation approach given the paper is correct and useful
Keywords
combinatorial circuits; fault location; logic testing; cut theorem; fault diagnosis; input vector pairs; large combinational circuits; logic circuits; test generation; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Digital circuits; Fault diagnosis;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location
Shenzhen
Type
conf
DOI
10.1109/CICCAS.1991.184402
Filename
184402
Link To Document