Title :
Analysing the atom-surface interaction through nanocell spectroscopy
Author :
Hamdi, I. ; Todorov, P. ; Maurin, I. ; Yarovitski, A. ; Dutier, G. ; Saltiel, S. ; Gorza, M.-P. ; Fichet, M. ; Bloch, D. ; Ducloy, M.
Author_Institution :
Lab. de Physique des Lasers, CNRS, Villetaneuse, France
Abstract :
In this paper, the strong van der Waals (vW) shift induced on high-lying excited states is investigated, such as Cs(6D), that is probed at 917 nm (6D52/) or 921 nm (6D32/) after a prior excitation on the Cs D2 line 6S12/→6P32/ at 852 nm. The analysis currently encompass a 40-130 nm range of thickness, leading to the observation of frequency shifts-relatively to the transition frequency in the free-space- as large as -∼10 GHz. The van der Waals potential between two walls is predicted to obey a transcendental Lerch function, as a result of the induced multiple "electric images", and to follow a L dependence (L : the local thickness).
Keywords :
atom-surface impact; caesium; excited states; van der Waals forces; Cs; atom-surface interaction; excited states; frequency shifts; nanocell spectroscopy; transcendental Lerch function; transition frequency; van der Waals potential; van der Waals shift; Atom lasers; Atomic beams; Atomic measurements; Frequency; Optical device fabrication; Optical reflection; Probes; Resonance; Spectroscopy; Strontium;
Conference_Titel :
Quantum Electronics Conference, 2005. EQEC '05. European
Print_ISBN :
0-7803-8973-5
DOI :
10.1109/EQEC.2005.1567367