De-embedding system noise from two-channel low-frequency noise measurements

Author

Sevimli, Oya ; Parker, Anthony E. ; Mahon, Simon J. ; Fattorini, Anthony P.

Author_Institution

Dept. of Eng., Macquarie Univ., Sydney, NSW, Australia

fYear

2013

fDate

24-28 June 2013

Firstpage

1

Lastpage

4

Abstract

Two-channel noise measurements are useful for obtaining all four noise parameters of a transistor for circuit simulation and for locating the noise sources inside. It is also easier to stabilise the transistor during two-channel measurements, as only one set of terminations are needed. New matrix equations are derived for de-embedding the system noise for a two-channel measurement system with unidirectional amplifiers that are typically used for low-frequency measurements. The new method is verified by measuring the noise correlation matrices of two-port resistors and applied to the measurement of low-frequency noise of an on-wafer transistor.

Keywords

amplifiers; circuit simulation; frequency measurement; matrix algebra; noise measurement; semiconductor device noise; transistors; circuit simulation; low-frequency measurements; matrix equations; noise correlation matrices; noise parameters; noise source location; on-wafer transistor; system noise; system noise deembedding; transistor stabilisation; two-channel low-frequency noise measurements; unidirectional amplifiers; Density measurement; Equations; Frequency measurement; Noise; Noise measurement; Resistors; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Noise and Fluctuations (ICNF), 2013 22nd International Conference on

Conference_Location

Montpellier

Print_ISBN

978-1-4799-0668-0

Type

conf

DOI

10.1109/ICNF.2013.6579002

Filename

6579002