Title :
A smear-suppressing CCD imager
Author :
Kuroda, Tadahiro ; Kuriyama, Toshihide ; Matsuda, Yuuki ; Kozono, T. ; Matsumoto, Shinichi ; Hiroshima, Yasushi ; Horii, K.
Author_Institution :
Masushita Semiconductor Laboratory, Osaka, Japan
Abstract :
This report will describe a 502×600 element interline-transfer CCD imager which realizes a 100-fold reduction in smear level, through the use of a flared photodiode structure.
Keywords :
Charge coupled devices; Electrons; Image sensors; Laboratories; Lighting; Photodiodes; Semiconductor diodes; Solid state circuits; Substrates; TV;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1986 IEEE International
Conference_Location :
Anaheim, CA, USA
DOI :
10.1109/ISSCC.1986.1157017
