• DocumentCode
    2886056
  • Title

    High-Q VHF micromechanical contour-mode disk resonators

  • Author

    Clark, J.R. ; Wan-Thai Hsu ; Nguyen, C.T.-C.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    2000
  • fDate
    10-13 Dec. 2000
  • Firstpage
    493
  • Lastpage
    496
  • Abstract
    A micromechanical, laterally vibrating disk resonator, fabricated via a technology that combines polysilicon surface-micromachining and metal electroplating to attain submicron lateral capacitive gaps, has been demonstrated at frequencies approaching 160 MHz with Q´s as high as 9,400-the highest demonstrated to date for an on-chip resonator in this frequency range. This frequency also represents the highest to date for an electrostatically transduced micromechanical resonator and is an important step towards reaching the frequencies required by the RF front-ends in wireless transceivers. The geometric dimensions necessary to reach a given frequency are larger for this contour-mode than for the flexural-modes used by previous resonators. This, coupled with its unprecedented Q value, makes this disk resonator a choice candidate for use in the IF and RF stages of future miniaturized transceivers.
  • Keywords
    Q-factor; VHF oscillators; electroplating; land mobile radio; micromachining; micromechanical resonators; transceivers; 160 MHz; IF stage; Q value; RF stage; VHF; contour-mode; electrostatically transduced micromechanical resonator; geometric dimensions; laterally vibrating disk resonator; metal electroplating; micromechanical contour-mode disk resonators; miniaturized transceivers; polysilicon surface-micromachining; submicron lateral capacitive gaps; wireless transceivers; Bandwidth; Electrodes; Electrostatics; Micromechanical devices; Oscillators; Radio frequency; Resonant frequency; Resonator filters; Transceivers; Wireless communication;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-6438-4
  • Type

    conf

  • DOI
    10.1109/IEDM.2000.904363
  • Filename
    904363