Title :
An Investigation Into The Role Of The Allan Variance In Establishing A Reference Standard Of Voltage
Author_Institution :
John Fluke Mfg. Co., Inc.
Abstract :
Allan´s ratio test for non-white noise is mathematically equivalent to the F-test for goodness-of-fit. Thus, Allan´s test is not strictly a test for non-white noise, but a test for time dependent relationships in the data set. Its usefulness for solid state references is being investigated.
Conference_Titel :
Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
Conference_Location :
Ibaraki, Japan
DOI :
10.1109/CPEM.1988.671148
