• DocumentCode
    28862
  • Title

    Ceramic Column Grid Array Assembly Qualification and Reliability Analysis for Space Missions

  • Author

    Tripathi, Shivendra ; Patel, Hitesh M. ; Patil, Shrikant A. ; Pandey, Deep Kumar ; Prajapati, Ishwar Lal ; Joshi, Chandresh N. ; Sharma, Rakesh S. ; Arora, Rajkumar

  • Author_Institution
    Space Applic. Centre, Indian Space Res. Organ., Ahmedabad, India
  • Volume
    5
  • Issue
    2
  • fYear
    2015
  • fDate
    Feb. 2015
  • Firstpage
    279
  • Lastpage
    286
  • Abstract
    Ceramic column grid array (CCGA) devices are presently the state-of-the-art packaging solutions for advanced computational electronics. For high-reliability applications incorporating thermal and vibration loads, CCGA columns provide more compliant interconnect during thermal cycle of the assembly and improve interconnection reliability by design. Assembly of such high interconnect count device requires process development and qualification prior to their deployment in space borne payloads. CCGA assembly process development, comprehensive assembly qualification tests (thermal cycling, vibration, humidity, microsectioning, and 3-D Computed Tomography X-ray inspection), and reliability estimation are presented in this paper.
  • Keywords
    assembling; ceramic packaging; interconnections; reliability; space vehicle electronics; CCGA assembly process development; CCGA devices; advanced computational electronics; ceramic column grid array assembly qualification; compliant interconnect; comprehensive assembly qualification tests; high interconnect count device; interconnection reliability; packaging solutions; reliability analysis; reliability estimation; space borne payloads; space missions; thermal cycle; thermal loads; vibration loads; Assembly; Electronic packaging thermal management; Joints; Materials; Reliability; Stress; Vibrations; 3-D-CT X-ray; Ceramic column grid array (CCGA) assembly; ceramic column grid array (CCGA) assembly; coefficient of thermal expansion (CTE); failure rate; microsectioning; qualification; reliability; thermal cycling; thermal cycling.;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2014.2383172
  • Filename
    7015559