Title :
The impact of characteristic impedance on waveform calibrations
Author :
Williams, Dylan F. ; Jargon, Jeffrey A. ; Hale, Paul D.
Abstract :
We examine the impact of characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of coplanar lines can lead to statistically significant errors in the calibrations in both the time and frequency domains.
Keywords :
calibration; coplanar waveguides; electric impedance measurement; electro-optical effects; frequency-domain analysis; time-domain analysis; characteristic impedance impact; coplanar line; coplanar waveguide; frequency domain analysis; high-speed electrooptic sampling measurement; impedance measurement; mismatch correction; temporal waveform calibration; time domain analysis; Frequency measurement; Measurement uncertainty; Microwave FET integrated circuits; Microwave integrated circuits; Microwave measurement; Microwave theory and techniques; Q measurement; Characteristic impedance; coplanar waveguide; electro-optic sampling; mismatch correction; on-wafer measurement; temporal waveform measurement;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
DOI :
10.1109/ARFTG.2013.6579023
