Title :
Multiple frequency parametric devices
Author_Institution :
General Electric Co., Syracuse, NY, USA
Keywords :
Bandwidth; Frequency conversion; Frequency measurement; Gain measurement; Laboratories; Oscillators; Semiconductor diodes; Tunable circuits and devices; Tuned circuits;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1959 IEEE International
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/ISSCC.1959.1157038
