Title :
Test port cable instability and VNA measurement errors
Author :
Liu, J.C. ; Ken Wong
Author_Institution :
Agilent Technol., Inc., Santa Rosa, CA, USA
Abstract :
Test port cables are often analyzed to determine the quality of their stability performance. However, the actual impact of their instability often is overlooked or not accounted properly. Cable stability measurements using traditional methods, such as using a short, do not correlate to the impact of cable instability on DUT measurements. An alternative method is presented that use ECal to analyze cable stability that provides a greater degree of insight on how DUT measurements are impacted by cable instability. In addition, methods to minimize the impact of cable instability are examined.
Keywords :
cable testing; measurement errors; network analysers; DUT measurements; ECal; VNA measurement errors; cable stability measurements; stability performance; test port cable instability; Area measurement; Atmospheric measurements; Frequency measurement; Particle measurements; VNA; cable instability; calibration; error correction; measurement errors;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
DOI :
10.1109/ARFTG.2013.6579032