Title :
Realization of a built-in self-test for integrated circuits based on reconfiguration
Author_Institution :
Vladimir State Univ., Vladimir, Russia
Abstract :
The solution of built-in self-test based on Oscillation-BIST concept and oriented on usage together with analog and mixed-signal IC and taking into account tolerances on parameters of analog subcircuits´ internal components has been proposed. The main attention has been paid to architecture of testing subcurcuit, realization of measurement circuit and the estimating oscillated frequency of circuit under test. The experimental results have been described for second-order active filter.
Keywords :
active filters; analogue integrated circuits; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; analog integrated circuits; analog subcircuit internal components; built-in self-test; mixed-signal integrated circuits; oscillation-BIST concept; second-order active filter; Built-in self-test; Frequency measurement; Integrated circuits; MATLAB; Oscillators; SPICE;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4244-6954-3
DOI :
10.1109/APEDE.2010.5624083
