Title :
Microwave interferometric method for metal sheet thickness measurement
Author :
Hoffmann, Karel ; Skvor, Z.
Author_Institution :
Fac. of Electr. Eng., Czech Tech. Univ. in Prague, Prague, Czech Republic
Abstract :
A new microwave method capable of contactless thickness measurement of metal sheets with high resolution has been proposed. First experimental results in X-band are reported. The method is based on precise interferometric phase evaluation of a signal reflected step by step from two surfaces of a metal sheet whose thickness is to be measured. This is achieved using interference between the reflected and reference signals. Micrometer resolution at 10 GHz can be expected.
Keywords :
interference (signal); metals; micrometry; microwave measurement; thickness measurement; X-band; contactless thickness measurement; frequency 10 GHz; interference; metal sheet thickness measurement; micrometer resolution; microwave interferometric method; precise interferometric phase evaluation; reference signal; Antenna measurements; Frequency measurement; Metals; Microwave measurement; Microwave theory and techniques; Optical waveguides; Thickness measurement; Distance measurement; sheet thickness;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
DOI :
10.1109/ARFTG.2013.6579036
