DocumentCode
2886587
Title
Model of the designing the test structures on base the texts of different level
Author
Tkachenko, I.M. ; Zaharov, A.A.
Author_Institution
Saratov State Tech. Univ., Saratov, Russia
fYear
2010
fDate
22-23 Sept. 2010
Firstpage
343
Lastpage
346
Abstract
In article the model of the issue to information from the sources of the knowledges of different level is presented. The loss to information as a result of adapting the designed sources to determined condition is explored. The problem of the loss to information comparatively training in process of his perception of the under study material is considered. In article the motion information flows as signal with provision for use the achievements in sphere test technology is studied.
Keywords
circuit analysis computing; knowledge representation; security of data; information flow; information loss; knowledge presentation; sphere test technology; Adaptation model; Electron beams; Focusing; Materials; Periodic structures; Training;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on
Conference_Location
Saratov
Print_ISBN
978-1-4244-6954-3
Type
conf
DOI
10.1109/APEDE.2010.5624089
Filename
5624089
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