Title :
Model of the designing the test structures on base the texts of different level
Author :
Tkachenko, I.M. ; Zaharov, A.A.
Author_Institution :
Saratov State Tech. Univ., Saratov, Russia
Abstract :
In article the model of the issue to information from the sources of the knowledges of different level is presented. The loss to information as a result of adapting the designed sources to determined condition is explored. The problem of the loss to information comparatively training in process of his perception of the under study material is considered. In article the motion information flows as signal with provision for use the achievements in sphere test technology is studied.
Keywords :
circuit analysis computing; knowledge representation; security of data; information flow; information loss; knowledge presentation; sphere test technology; Adaptation model; Electron beams; Focusing; Materials; Periodic structures; Training;
Conference_Titel :
Actual Problems of Electron Devices Engineering (APEDE), 2010 International Conference on
Conference_Location :
Saratov
Print_ISBN :
978-1-4244-6954-3
DOI :
10.1109/APEDE.2010.5624089
