DocumentCode
28866
Title
A good fit
Author
Davies, D.
Author_Institution
IET, Stevenage, UK
Volume
49
Issue
7
fYear
2013
fDate
March 28 2013
Firstpage
437
Lastpage
437
Abstract
A US-based team have expanded their model of III-V materials interfaces to include series resistance and dielectric leakage behaviour.
Keywords
III-V semiconductors; dielectric materials; leakage currents; III-V materials interfaces; dielectric leakage behaviour; semiconductor materials; series resistance;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el.2013.0874
Filename
6504949
Link To Document