• DocumentCode
    2886609
  • Title

    Application of metal-induced unilaterally crystallized polycrystalline silicon thin-film transistor technology to active-matrix organic light-emitting diode displays

  • Author

    Zhiguo Meng ; Haiying Chen ; Chengfeng Qiu ; Liduo Wang ; Kwok, H.S. ; Man Wong

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Kowloon, China
  • fYear
    2000
  • fDate
    10-13 Dec. 2000
  • Firstpage
    611
  • Lastpage
    614
  • Abstract
    Active matrix (AM) flat-panel displays (FPDs) based on organic light-emitting diodes (OLEDs) are being hotly pursued as alternatives to liquid crystal displays (LCDs). Unlike LC pixels, which are voltage-driven, OLED pixels are current-driven, Since the amorphous silicon (a-Si) thin-film transistors (TFTs) typically used in LCDs suffer from limited current-driving capability and high photosensitivity, polycrystalline silicon (poly-Si) TFTs based on metal-induced unilateral crystallization (MIUC) of a-Si are investigated for AMOLED displays. Particular attention is paid to (1) optimizing TFT structural design and (2) resolving issues related to the integration of MIUC TFT and OLED.
  • Keywords
    LED displays; crystallisation; driver circuits; elemental semiconductors; flat panel displays; silicon; thin film transistors; AMOLED displays; MIUC; OLED pixels; Si; TFT structural design; active-matrix organic light-emitting diode displays; current-driving capability; flat-panel displays; metal-induced unilaterally crystallized material; polysilicon thin-film transistor; Active matrix liquid crystal displays; Active matrix organic light emitting diodes; Amorphous silicon; Crystallization; Design optimization; Flat panel displays; Liquid crystal displays; Organic light emitting diodes; Thin film transistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-6438-4
  • Type

    conf

  • DOI
    10.1109/IEDM.2000.904394
  • Filename
    904394