Title :
Using lines of arbitrary impedance as standards on the TRL calibration technique
Author :
Reynoso-Hernandez, J.A. ; Pulido-Gaytan, M.A. ; Zarate-de Landa, A. ; Zuniga-Juarez, J.E. ; Monjardin-Lopez, J.R. ; Garcia-Osorio, A. ; Orozco-Navarro, D. ; Loo-Yau, J.R. ; Maya-Sanchez, M.C.
Author_Institution :
Centro de Investigaci??n Cient??fica y de Educaci??n Superior de Ensenada (CICESE), Ensenada B.C., M??xico
Abstract :
Using the wave cascading matrix formalism and the 8-term error model for modeling the imperfect measurement system vector network analyzer a new approach of the Thru-Reflect-Line (TRL) calibration technique is introduced and compared with the already existing TRL calibration technique. This new approach allows the utilization of arbitrary characteristic impedance lines as calibration elements, being very useful for high power device characterization which requires impedance transformers. The proposed algorithm differs from the classical TRL in the procedure used to refer the DUT S-parameters to the system impedance.
Keywords :
Calibration; Impedance; Power transmission lines; Scattering parameters; Transistors; Transmission line matrix methods; Transmission line measurements; TRL calibration; Vector network analyzer (VNA); characteristic impedance; wave cascading matrix;
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2013 81st ARFTG
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-4981-9
DOI :
10.1109/ARFTG.2013.6579059