DocumentCode :
2886956
Title :
Sensitivity improvement in progressive-scan FT-CCDs for digital still camera applications
Author :
van Kuijk, H.C. ; Bosiers, J.T. ; Kleimann, A.C. ; Le Cam, L. ; Maas, J.P. ; Peek, H.L. ; Peschel, C.R.
Author_Institution :
Philips Semicond. Image Sensors, Eindhoven, Netherlands
fYear :
2000
fDate :
10-13 Dec. 2000
Firstpage :
689
Lastpage :
692
Abstract :
Sensitivity improvements in a 3.2 M-pixel CCD image sensor developed for digital still camera applications are presented. The introduction of gap-less microlenses increases the sensitivity with 25-30% while the high angular response is maintained. With the binning possibility at the image-storage transition, the sensitivity in monitor mode can be increased. Finally the sensor output amplifier now combines low noise and excellent linearity with a much higher conversion factor. This improvement is obtained by reduced parasitic capacitances around the Floating Diffusion area.
Keywords :
CCD image sensors; cameras; microlenses; sensitivity; 3.2 Mpixel; angular response; binning; conversion factor; digital still camera; floating diffusion; gapless microlens; image storage transition; linearity; monitor mode; noise; output amplifier; parasitic capacitance; progressive-scan FT-CCD image sensor; sensitivity; Charge coupled devices; Charge-coupled image sensors; Digital cameras; Image storage; Lenses; Linearity; Low-noise amplifiers; Microoptics; Pixel; Semiconductor device noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-6438-4
Type :
conf
DOI :
10.1109/IEDM.2000.904412
Filename :
904412
Link To Document :
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