• DocumentCode
    2887037
  • Title

    Automated on-wafer characterization in micro-machined resonators: towards an integrated test vehicle for bulk acoustic wave resonators (FBAR)

  • Author

    Campanella, Humberto ; Nouet, Pascal ; De Paco, Pedro ; Uranga, Arantxa ; Barniol, Nuria ; Esteve, Jaume

  • Author_Institution
    Centra Nacional de Microelectron, Bellaterra
  • fYear
    2007
  • fDate
    19-22 March 2007
  • Firstpage
    157
  • Lastpage
    161
  • Abstract
    Electrical on-wafer characterization in FBAR is automated by means of a wide-band parameter extraction algorithm, in order to define a complete characterization vehicle for FBAR and MEMS resonators. A model of FBAR-substrate losses is proposed and an automation algorithm implementing a multi-step least-squares strategy is presented. Extraction of the equivalent-circuit parameters is performed from experimental s-parameter data acquired by a microwave network analyzer. The results of FBAR and substrate characterization are presented, and the basis of an integrated test vehicle is discussed.
  • Keywords
    S-parameters; automatic test equipment; bulk acoustic wave devices; equivalent circuits; least squares approximations; micromechanical resonators; microwave measurement; network analysers; semiconductor device measurement; MEMS resonators; S-parameter; automated on-wafer characterization; bulk acoustic wave resonators; equivalent circuit parameters; micromachined resonators; microwave network analyzer; multistep least-squares strategy; wide-band parameter extraction; Acoustic testing; Acoustic waves; Automatic testing; Automation; Data mining; Film bulk acoustic resonators; Micromechanical devices; Parameter extraction; Vehicles; Wideband; Thin-film bulk acoustic wave resonators; automatic testing; equivalent circuits; parameter extraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    1-4244-0781-8
  • Electronic_ISBN
    1-4244-0781-8
  • Type

    conf

  • DOI
    10.1109/ICMTS.2007.374474
  • Filename
    4252424