Title :
Measurement of low-frequency noise spectrum and computation of its parameters
Author :
Tao, Luo ; Yong, Xu ; Yisong, Dai ; Yaowu, Shi
Author_Institution :
Dept. of Electron. Eng., Jilin Univ. of Technol., Changchun, China
Abstract :
In this paper, a low-frequency noise spectrum testing system is presented, its measuring range is 0.25 Hz~100 kHz, and accuracy is higher than 4%. Moreover, the white noise level and corner frequency are computed by applying the weighed least square method
Keywords :
automatic test equipment; electric noise measurement; white noise; 0.25 Hz to 100 kHz; ATE; LF noise; noise spectrum; testing system; weighed least square method; white noise level; Circuit noise; Current measurement; Electrical resistance measurement; Frequency; Low-frequency noise; Noise measurement; Noise reduction; Power measurement; Semiconductor device noise; Voltage;
Conference_Titel :
Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on
Conference_Location :
Shenzhen
DOI :
10.1109/CICCAS.1991.184476
