Title :
Leakage current reduction in CMOS logic circuits
Author :
Lin, Heng-Yao ; Lin, Chi-Sheng ; Chiou, Lih-Yih ; Liu, Bin-Da
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Abstract :
In this paper, a novel logic gate design with low leakage is proposed. Traditionally, the subthreshold leakage through a logic gate depends on the applied input vector. In order to reduce leakage power, we stack an extra transistor in the large leakage path. The proposed structure induces low leakage current under all possible inputs. Compared to the conventional CMOS logic circuit design, the simulation results show that the proposed logic circuits not only reduce significant leakage power dissipation, but also keep similar circuit performance as conventional CMOS logic circuits
Keywords :
CMOS logic circuits; integrated circuit design; leakage currents; logic gates; transistor circuits; CMOS logic circuits; input vector; leakage current reduction; leakage power reduction; logic gate design; power dissipation; subthreshold leakage; transistor; CMOS logic circuits; CMOS technology; Couplings; Leakage current; Logic gates; MOSFET circuits; Stacking; Subthreshold current; Threshold voltage; Tunneling;
Conference_Titel :
Circuits and Systems, 2004. Proceedings. The 2004 IEEE Asia-Pacific Conference on
Conference_Location :
Tainan
Print_ISBN :
0-7803-8660-4
DOI :
10.1109/APCCAS.2004.1412767