DocumentCode
2887198
Title
Damage initiation and propagation modeling using Energy Partitioning Damage Evolution model for Pb-free solder materials
Author
Ladani, Leila J.
Author_Institution
Mech. & Aerosp. Eng., Utah State Univ., Logan, UT, USA
fYear
2010
fDate
2-5 June 2010
Firstpage
1
Lastpage
5
Abstract
Thermo-mechanical fatigue and damage has always been an issue for solder joint materials used in micro-electronic devices. Accurate prediction of the damage and crack is essential in order to predict the life of these joints. This paper presents a finite element modeling approach that is used in conjunction with Energy Partitioning Damage Evolution (EPDE) model to determine the state of damage, update the constitutive properties of material and determine the crack initiation and propagation site and time in BGA solder joints. A non-linear visco-plastic finite element modeling is used to successively initiate and propagate the crack. Constitutive properties of elements are updated based on the amount of damage that they accumulate in each step. Elements with excessive damage are eliminated from the structure. Finite element results show that as elements accumulate damage, they are softened and thus can stand more strain. Therefore, the damage accumulation rate decreases. It also shows the initiation site and propagation path very accurately which is confirmed with experiments.
Keywords
ball grid arrays; crack detection; finite element analysis; fracture mechanics; solders; thermomechanical treatment; BGA solder joints; EPDE model; crack initiation; elements constitutive properties; energy partitioning damage evolution model; microelectronic devices; nonlinear visco plastic finite element modeling; solder joint materials; thermomechanical fatigue; Capacitive sensors; Creep; Equations; Fatigue; Finite element methods; Plastics; Soldering; Stress; Temperature; Thermomechanical processes; Thermo-mechanical damage; crack; finite element; pb-free solder joints; successive initiation and propagation;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location
Las Vegas, NV
ISSN
1087-9870
Print_ISBN
978-1-4244-5342-9
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2010.5501270
Filename
5501270
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