• DocumentCode
    2887274
  • Title

    Peridynamic-models using finite elements for shock and vibration reliability of leadfree electronics

  • Author

    Lall, Pradeep ; Shantaram, Sandeep ; Panchagade, Dhananjay

  • Author_Institution
    Dept. of Mech. Eng., Auburn Univ., Auburn, AL, USA
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    12
  • Abstract
    Electronic packages subjected to drop and shock have been simulated using alternative theory known as peridynamic theory in the realm of FEM. In peridynamics, problems are formulated in terms of integral equation which is a substitute to conventional solid mechanics theory where problems are formulated in terms of partial differential equations. This alternative approach is more potent than conventional finite-element method because the integral equations remain valid even at discontinuities which enables to model crack initiation and crack propagation which can occur at multiple locations simultaneously. Previously, Agwai [2008] has demonstrated the use of peridynamic models using EMU code. In this paper, a peridynamic-theory based drop and shock model has been developed via finite element code using truss elements [Macek 2007]. The method enables the implementation of peridynamic theory in a commercial finite-element platform. Model predictions of peridynamic-models have been validated with experimentation for leadfree solder alloys system.
  • Keywords
    electronics packaging; finite element analysis; integral equations; partial differential equations; solders; vibrations; EMU code; FEM; crack initiation modelling; crack propagation modelling; electronic packaging; finite element code; finite element modelling; integral equation; integral equations; lead free electronics; leadfree solder alloys system; partial differential equations; peridynamic models; shock reliability; solid mechanics theory; truss elements; vibration reliability; Circuit testing; Electric shock; Electronics packaging; Finite element methods; Integral equations; Lead; Partial differential equations; Predictive models; Solids; Vibrations; Drop; Electronic package; Explicit Finite-Elements; Impact; Peridynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501274
  • Filename
    5501274