• DocumentCode
    2887305
  • Title

    Interfacial failure simulation of single solder joint using a multiscale approach

  • Author

    Gao, Feng ; Qu, Jianmin ; Liang, Frank Z. ; Williams, Richard L.

  • Author_Institution
    McCormick Sch. of Eng. & Appl. Sci., Northwestern Univ., Evanston, IL, USA
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The interface damage of single solder joint was simulated using cohesive zone model incorporated in finite element analysis. In this study, the solder/IMC/Cu pad interfaces models were constructed for the molecular dynamics simulation. The traction-separation law was derived when the interface model was subjected to a principle strain in one direction. The materials properties of cohesive element for finite element analysis (FEA) were then extracted from the molecular dynamics (MD) calculations. The multiscale simulation results show that the interface damage can be captured well based on the cohesive zone model coupling with MD simulation results, particular when the brittle failure is the dominant mode at the interfaces of single solder joint.
  • Keywords
    finite element analysis; molecular dynamics method; solders; cohesive element; cohesive zone model; finite element analysis; interface damage; interfacial failure simulation; materials properties; molecular dynamics simulation; multiscale approach; single solder joint; solder/IMC/Cu pad interfaces model; traction-separation law; Analytical models; Bonding; Boundary conditions; Computational modeling; Dielectric materials; Electronic mail; Environmentally friendly manufacturing techniques; Finite element methods; Lead; Soldering; Lead-free solder; cohesive element; finite element; interface; molecular dynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501276
  • Filename
    5501276