DocumentCode :
28874
Title :
Millimeter-Wave Tunable Notch Filter Based on Waveguide Extension for Plasma Diagnostics
Author :
Danilov, Y.Y. ; Denisov, Gregory G. ; Khozin, Mikhail A. ; Panin, Anatoly ; Rodin, Yury
Author_Institution :
Inst. of Appl. Phys., Nizhny Novgorod, Russia
Volume :
42
Issue :
6
fYear :
2014
fDate :
Jun-14
Firstpage :
1685
Lastpage :
1689
Abstract :
A millimeter-wave tunable notch filter using several extensions of the fundamental-mode rectangular waveguide has been developed to protect plasma diagnostics techniques from stray gyrotron radiation. The design utilizes the resonant behavior of the TE301 mode excited by cutoff coupling holes in a symmetrical smooth H-plane extension of waveguide. Proper choice of the shape and sizes of the coupling elements allows one to tune the operating frequency, notch depth, and notch band. Low-power experiments with the six-cavity filters show a maximal notch depth of below -120 dB at 70 and 170 GHz, and a notch depth of below -90 dB at frequency bands of 70 ± 0.05 and 170 ± 0.2 GHz. The filter design is rather simple and can be advanced into a higher frequency band up to the 400 GHz.
Keywords :
gyrotrons; millimetre wave filters; notch filters; plasma diagnostics; plasma filled waveguides; rectangular waveguides; coupling element shape; coupling element size; cutoff coupling holes; design; filter design; frequency 170 GHz; frequency 70 GHz; fundamental-mode rectangular waveguide; low-power experiments; millimeter-wave tunable notch filter; notch band; notch depth; operating frequency; plasma diagnostics; six-cavity filters; stray gyrotron radiation; symmetrical smooth H-plane waveguide extension; waveguide extension; Cavity resonators; Couplings; Millimeter wave technology; Physics; Plasma diagnostics; Rectangular waveguides; Cavities; coupling holes; millimeter waves; notch filter; plasma diagnostics; rectangular waveguide extensions; rectangular waveguide extensions.;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/TPS.2014.2318352
Filename :
6823753
Link To Document :
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