Title :
Designing for Reliability
Author :
Klevenow, Fred ; Al Wehman
Author_Institution :
Lorain Products, 1122 F Street, Lorain, Ohio 44052
Abstract :
This paper considers basic concepts of reliability of an electronic system. Basic terms are defined, and the effect of electrical stress, temperature and quality on reliability are graphed for various components per MIL-HDBK-217D. The reliability of a sample rectifier is then examined.
Keywords :
Aircraft manufacture; Diodes; Environmental factors; History; Q factor; Rectifiers; Stress; System testing; Temperature; Time measurement;
Conference_Titel :
Telecommunications Energy Conference, 1984. INTELEC '84. International
Conference_Location :
New Orleans, LA, USA
DOI :
10.1109/INTLEC.1984.4794172
