DocumentCode :
2887622
Title :
Thermal fatigue life evaluation of CSP joints by mechanical fatigue testing
Author :
Kanda, Yoshihiko ; Zama, Kunihiro ; Kariya, Yoshiharu ; Oota, Hironori ; Kikuchi, Shunichi ; Yamabe, Hideki ; Nakamura, Kazuhiko
Author_Institution :
Grad. Sch., Shibaura Inst. of Technol., Tokyo, Japan
fYear :
2010
fDate :
2-5 June 2010
Firstpage :
1
Lastpage :
5
Abstract :
The interrelation between a thermal cycle test and a mechanical shear fatigue test has been studied for CSP joints from the view point of fatigue life and the microstructural damage of solder joints. The fatigue lives in both methods are almost equivalent even though loading method is different. From the viewpoint of microstructure, the fact is attributed to that the transgranular failure is predominant mode and a microstructural coarsening which is induced by thermal loading and stress equivalent for both the thermal cycle test and the mechanical shear fatigue test.
Keywords :
electronics packaging; life testing; solders; thermal stress cracking; CSP joints; chip size package; mechanical fatigue testing; mechanical shear fatigue test; microstructural coarsening; microstructural damage; solder joints; thermal cycle test; thermal fatigue life evaluation; Capacitive sensors; Fatigue; Life testing; Materials science and technology; Packaging; Soldering; Temperature; Thermal loading; Thermal resistance; Thermal stresses; CSP; Mechanical fatigue test; Microstructure; Sn-Ag-Cu; Thermal cycle test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1087-9870
Print_ISBN :
978-1-4244-5342-9
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2010.5501291
Filename :
5501291
Link To Document :
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