DocumentCode
2887665
Title
Application of thermo-viscoelastic laminated plate theory to predict warpage of printed circuit boards
Author
Kobayashi, Takaya ; Sato, Masami
Author_Institution
Mech. Design & Anal. Corp., Tokyo, Japan
fYear
2010
fDate
2-5 June 2010
Firstpage
1
Lastpage
7
Abstract
The rapid assembly of printed circuit boards to meet the desired goal of thinning the board creates more complexity in the reflow process, to control the occurrence of warpage in the board. Therefore, certain methods are preferred for simply yet accurately predicting the amount of warpage inevitable in the reflow process. Responding to such a need, the study was carried out aiming to provide a specific numerical method based on the multilayered plate theory, resulting in a simple procedure capable of supplying an accurate estimation of the warped deformation of the board. The program, which is equipped with the developed method, can give an arbitrary temperature history to a multilayered plate consisting of an arbitrary number of layers. This program can designate a temperature-dependent viscoelasticity and temperature-dependent thermal expansion coefficient to each layer. The estimation results derived from this method were compared with the FEM analysis results and confirmed to be in good agreement. Application of this method is designed for ease of use to estimate the warpage at any stage of planning and design.
Keywords
assembling; finite element analysis; printed circuit design; reflow soldering; thermal expansion; thermal management (packaging); viscoelasticity; FEM analysis; multilayered plate theory; numerical method; printed circuit board; rapid assembly; reflow process; temperature-dependent thermal expansion coefficient; temperature-dependent viscoelasticity; thermo-viscoelastic laminated plate theory; warpage; warped deformation; Assembly; Elasticity; History; Printed circuits; Process control; Resins; Stress; Temperature sensors; Thermal expansion; Viscosity;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location
Las Vegas, NV
ISSN
1087-9870
Print_ISBN
978-1-4244-5342-9
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2010.5501293
Filename
5501293
Link To Document