Title :
An 8Kbyte intelligent cache memory
Author_Institution :
NEC IC Microcomputer Systems, Kanagawa, Japan
Keywords :
Cache memory; Circuit testing; Clocks; Memory management; Microprocessors; Monitoring; National electric code; Random access memory; Read-write memory; System buses;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1987 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1987.1157109
