Title :
The reliability of neural networks on pattern recognition
Author :
Takahashi, Hirokazu ; Pecharanin, Narade ; Akima, Yoshinao ; Sone, Mototaka
Author_Institution :
Dept. of Electr. & Electron. Eng., Musashi Inst. of Technol., Tokyo, Japan
fDate :
27 Jun-2 Jul 1994
Abstract :
Researches on pattern recognition using neural networks (NN) have mainly been studied about the speed of training or the recognition rate. However, nobody has so far studied about the reliability whether NN distinguish the pattern by the right judgement or not. Therefore, this paper defines the ideal condition between the hidden layer and the output layer in order to consider the reliability of NN. As the result, the reliability rates of NN are calculated by using 3 types of training data, and the training data to get a high reliability rate is suggested
Keywords :
circuit reliability; learning (artificial intelligence); neural nets; pattern recognition; performance evaluation; hidden layer; neural networks; output layer; pattern recognition; reliability; training data; Neural networks; Pattern recognition; Speech recognition; Training data;
Conference_Titel :
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-1901-X
DOI :
10.1109/ICNN.1994.374722
