DocumentCode
288771
Title
The reliability of neural networks on pattern recognition
Author
Takahashi, Hirokazu ; Pecharanin, Narade ; Akima, Yoshinao ; Sone, Mototaka
Author_Institution
Dept. of Electr. & Electron. Eng., Musashi Inst. of Technol., Tokyo, Japan
Volume
5
fYear
1994
fDate
27 Jun-2 Jul 1994
Firstpage
3067
Abstract
Researches on pattern recognition using neural networks (NN) have mainly been studied about the speed of training or the recognition rate. However, nobody has so far studied about the reliability whether NN distinguish the pattern by the right judgement or not. Therefore, this paper defines the ideal condition between the hidden layer and the output layer in order to consider the reliability of NN. As the result, the reliability rates of NN are calculated by using 3 types of training data, and the training data to get a high reliability rate is suggested
Keywords
circuit reliability; learning (artificial intelligence); neural nets; pattern recognition; performance evaluation; hidden layer; neural networks; output layer; pattern recognition; reliability; training data; Neural networks; Pattern recognition; Speech recognition; Training data;
fLanguage
English
Publisher
ieee
Conference_Titel
Neural Networks, 1994. IEEE World Congress on Computational Intelligence., 1994 IEEE International Conference on
Conference_Location
Orlando, FL
Print_ISBN
0-7803-1901-X
Type
conf
DOI
10.1109/ICNN.1994.374722
Filename
374722
Link To Document