Title :
Next generation IC technology for analog/digital VLSI
Author_Institution :
Crystal Semiconductor, Austin, TX, USA
Abstract :
The panel will discuss IC technology from the circuit designer´s perspective. Today´s analog VLSI devices are limited to about 20K transistors, a small fraction of the complexity available in scaled MOS processes. Analog VLSI complexity is limited by such factors as design risk, testability, design talent, supply voltage and scaled device performance. The most successful next-generation processes will balance all of these factors. The reward will be unprecedented monolithic performance for telecommunications, instrumentation and video applications.
Keywords :
Analog integrated circuits; Application specific integrated circuits; CMOS process; CMOS technology; Circuit noise; Digital integrated circuits; Digital signal processing; Semiconductor device noise; Signal design; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1987 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1987.1157114
