• DocumentCode
    2887961
  • Title

    Thermo-mechanical properties of high performance thermal interface gap filler pads

  • Author

    Lee, Y.J.

  • Author_Institution
    Chomerics Div., Parker Hannifin, Woburn, MA, USA
  • fYear
    2010
  • fDate
    2-5 June 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    A thermal interface material (TIM) with the highest thermal conductivity does not automatically deliver the best thermal management performance. It is just as important to achieve the best surface contact between TIM and various substrates. Softer interface materials like silicone gap fillers tend to lower contact resistance and thermal impedance. More importantly, the low modulus of silicone gap fillers also decreases the stress due to the large mismatch of the coefficient of thermal expansion (CTE) in microelectronic packages with die chips, heat sinks, heat spreaders, and substrates. However, decreasing the modulus of the gap fillers is often associated with increased creep behavior under compression as well as poor recovery upon removal of the stress. The desired thermal gap fillers must remain elastic at low temperatures and keep thermal stability at high temperatures while still maintaining good thermal conductivity. For the investigation described herein, DMA (Dynamic Mechanical Analysis) was used to characterize the viscoelastic creep and stress relaxation properties of silicone gap fillers at various conditions. New thermal gap fillers using silicone chemistry were developed for this study to provide low modulus and high elasticity and were investigated along with commercially available silicone gap fillers. Thermal impedance properties at different operating conditions such as during long term exposure for elevated temperatures and humidity were also monitored with corresponding thermo-mechanical properties in DMA.
  • Keywords
    contact resistance; integrated circuit packaging; silicones; stress relaxation; thermal conductivity; thermal expansion; thermal management (packaging); thermal stability; coefficient of thermal expansion; contact resistance; dynamic mechanical analysis; heat sinks; microelectronic packages; silicone chemistry; silicone gap fillers; softer interface materials; stress relaxation property; thermal conductivity; thermal impedance; thermal interface gap filler pads; thermal management; thermal stability; thermomechanical property; viscoelastic creep; Conducting materials; Creep; Elasticity; Heat sinks; Surface resistance; Temperature; Thermal conductivity; Thermal management; Thermal stresses; Thermomechanical processes; compression; creep; gap pads; silicones; strain recovery; stress relaxation; thermal conductivity; thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1087-9870
  • Print_ISBN
    978-1-4244-5342-9
  • Electronic_ISBN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2010.5501306
  • Filename
    5501306