Title :
Proceedings. Fourth CSI/IEEE International Symposium on VLSI Design (Cat. No.91TH0340-0)
Abstract :
The following topics are dealt with: behavior-level circuit synthesis; logic circuit synthesis; state machine synthesis; processor synthesis; VLSI algorithms, layout, simulation, verification, defects, and yields; fault modeling and detection; multiprocessing for CAD; module generation; design for testability; BIST (built-in self-test); and interconnection networks
Keywords :
VLSI; built-in self test; circuit CAD; digital simulation; fault location; logic circuits; BIST; CAD; VLSI algorithms; behavior-level circuit synthesis; defects; design for testability; fault modeling; interconnection networks; layout; logic circuit synthesis; module generation; multiprocessing; processor synthesis; simulation; state machine synthesis; verification; yields;
Conference_Titel :
VLSI Design, 1991. Proceedings., Fourth CSI/IEEE International Symposium on
Conference_Location :
New Delhi, India
Print_ISBN :
0-8186-2125-7
DOI :
10.1109/ISVD.1991.185081
