Title :
Prediction of electrical contact resistivity in thermoelectric modules (TEMs) from module-level measurements
Author :
Annapragada, S. Ravi ; Salamon, Todd ; Kolodner, Paul ; Hodes, Marc ; Garimella, Suresh V.
Author_Institution :
Birck Nanotechnol. Center, Purdue Univ., West Lafayette, IN, USA
Abstract :
Thermoelectric modules (TEMs) are solid-state devices used for cooling, heating and power generation. An experimental apparatus was developed to characterize the performance of a TEM and heat sink assembly, where the TEM is operated in refrigeration mode. A numerical model was developed to simulate the experiments. Bulk and interfacial Ohmic heating, along with Peltier and Thomson effects were modeled with the inclusion of temperature-dependent bulk material properties, i.e., Seebeck coefficient, thermal conductivity and electrical conductivity. A novel, self-consistent characterization methodology was developed to obtain the electrical contact resistance of the TEM module based on the numerical simulations and the experiments. The electrical contact resistivity of the module tested was predicted to be approximately 1 × 10-9 Ωm2. The predictions match with the electrical contact resistivity obtained based on the performance specifications (ΔTmax) of the TEM.
Keywords :
Peltier effect; Seebeck effect; Thomson effect; electrical conductivity; electrical contacts; electrical resistivity; heat sinks; thermal conductivity; thermoelectric devices; Peltier effects; Seebeck coefficient; Thomson effects; electrical conductivity; electrical contact resistivity; heat sink assembly; module-level measurements; solid-state devices; temperature-dependent bulk material properties; thermal conductivity; thermoelectric modules; Contacts; Cooling; Electric variables measurement; Heat sinks; Heating; Power generation; Solid state circuits; Thermal conductivity; Thermoelectric devices; Thermoelectricity; TEM; electrical contact resistance; thermoelectric module;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-4244-5342-9
Electronic_ISBN :
1087-9870
DOI :
10.1109/ITHERM.2010.5501317