Title :
A semisupervised feature metric based band selection method for hyperspectral image classification
Author :
Chen Yang ; Sicong Liu ; Bruzzone, Lorenzo ; Renchu Guan ; Peijun Du
Author_Institution :
Coll. of Earth Sci., Jilin Univ., Changchun, China
Abstract :
This paper presents a novel semi-supervised band selection technique for classification of the hyperspectral image. In our proposed method, a simple and efficient metric learning algorithm, i.e. relevant component analysis, is adopted for learning the whitening transformation matrix from which a feature metric is constructed for feature selection. This metric assesses both the class discrimination capability of the single band and the spectral correlation between the any two bands. The affinity propagation technique is then employed as the clustering strategy to select an effective band subset from original spectral bands. Experimental results demonstrate that the proposed method can effectively select the representative bands and reduce the band redundancy for improving the classification accuracy. In addition, the comparison with some literature band selection methods also confirms the superiority of the proposed approach.
Keywords :
feature extraction; hyperspectral imaging; image classification; learning (artificial intelligence); matrix algebra; pattern clustering; affinity propagation technique; band selection method; class discrimination; classification accuracy; clustering strategy; feature selection; hyperspectral image classification; metric learning algorithm; relevant component analysis algorithm; semisupervised band selection technique; semisupervised feature metric; spectral correlation; whitening transformation matrix; Abstracts; Accuracy; Equations; Image recognition; Imaging; Indexes; Vegetation mapping; Affinity propagation; Band selection; Feature metric; Feature selection; Hyperspectral images; Relevant component analysis;
Conference_Titel :
Hyperspectral Image and Signal Processing: Evolution in Remote Sensing (WHISPERS), 2012 4th Workshop on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4799-3405-8
DOI :
10.1109/WHISPERS.2012.6874326