DocumentCode :
2888312
Title :
On the charging and thermal characterization of a micro/nano structured thermal ground plane
Author :
de Bock, H Peter J ; Chauhan, Shubhika ; Chamarthy, Pramod ; Weaver, Stanton E. ; Deng, Tao ; Gerner, Frank M. ; Ababneh, Mohammed T. ; Varanasi, Kripa
Author_Institution :
GE Global Res., Niskayuna, NY, USA
fYear :
2010
fDate :
2-5 June 2010
Firstpage :
1
Lastpage :
6
Abstract :
As power densities in electronic devices have increased dramatically over the last decade, advanced thermal management solutions are required. A significant part of the thermal resistance budget is commonly taken up by the heat spreader, which serves to reduce the input heat flux and connect to an increased area for heat removal. Thermal ground planes are devices that address this issue by utilizing two-phase heat transfer achieving higher effective thermal conductivities than conventional solid heat spreaders. This study describes the need for and design of a charging station to accurately dispense the working fluid and a thermal characterization experiment to characterize performance. The design study includes detailed analysis of accuracy and validation of the setup.
Keywords :
heat transfer; thermal conductivity; thermal management (packaging); thermal resistance; advanced thermal management; electronic devices; input heat flux; micronano structured thermal ground plane; power density; solid heat spreaders; thermal characterization experiment; thermal conductivity; thermal resistance budget; two-phase heat transfer; working fluid; Filling; Heat transfer; Land surface temperature; Resistance heating; Solids; Thermal conductivity; Thermal factors; Thermal management; Thermal management of electronics; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1087-9870
Print_ISBN :
978-1-4244-5342-9
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2010.5501325
Filename :
5501325
Link To Document :
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