DocumentCode
2888556
Title
An electromagnetic field distortion measurement system
Author
Kuipers, J.
Author_Institution
Calvin College
fYear
1988
fDate
7-10 June 1988
Firstpage
40
Lastpage
41
Abstract
A quaternion process on EM field data provide a precise six degree-of-freedom measure of position/field distortion between two low frequency variously polarized probes. The technique suggests other fundamental EM field measurement applications which relate to certain types of scattering and field distorting environments.
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 1988. CPEM 88 Digest. 1988 Conference on
Conference_Location
Ibaraki, Japan
Type
conf
DOI
10.1109/CPEM.1988.671161
Filename
671161
Link To Document