Title :
A VLSI 128-channel data link control
Author :
Chao, Paul ; Cyr, G. ; Hiller, Tobias ; King, R. ; Wilson, Richard
Author_Institution :
AT&T Bell Laboratories, Naperville, IL, USA
Abstract :
A controller with a 160K transistor automatically extracted from a behavorial description and fabricated in 1μm CMOS will be described. The chip is 367×390 mils, attaining a device density of 0.9mil2per transistor and dissipates 600mW at a clock rate of 8MHz.
Keywords :
Built-in self-test; Chaos; Circuit simulation; Circuit synthesis; Cyclic redundancy check; ISDN; Integrated circuit modeling; Microprocessors; Transmitters; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference. Digest of Technical Papers. 1987 IEEE International
Conference_Location :
New York, NY, USA
DOI :
10.1109/ISSCC.1987.1157156
