DocumentCode
2888680
Title
Advances in thermal interface technology: mono-metal interconnect formation, processing and characterisation
Author
Wunderle, B. ; Klein, M. ; Dietrich, L. ; Ras, M. Abo ; Mrossko, R. ; May, D. ; Schacht, R. ; Oppermann, H. ; Michel, B. ; Reichl, H.
Author_Institution
Fraunhofer Inst. Reliability & Microintegration, Berlin, Germany
fYear
2010
fDate
2-5 June 2010
Firstpage
1
Lastpage
10
Abstract
As the demand for new thermal technologies and materials has been increasing over the years to provide thermal solutions to the next generation of power electronics, microprocessors and high-power optical systems also thermal characterisation methods have to keep up with the pace of this development with respect to resolution and accuracy. We have developed both bulk and interface technologies to reduce thermal resistance using Ag and Au-based materials and low-T and low-p processes to render them eligible for the electronics industry. New processes to generate nano-enhanced surface structures as well as thermo-compression bonding are examined within this paper. Along with these processes especially designed test stands are described which are able to extract the effects achieved by the technological advances.
Keywords
gold; gold alloys; interconnections; lead bonding; microprocessor chips; nanotechnology; silver; silver alloys; tape automated bonding; thermal resistance; Ag; Au; high-power optical systems; microprocessors; monometal interconnect formation; nanoenhanced surface structures; power electronics; thermal interface technology; thermal resistance; thermocompression bonding; Electronics industry; Microprocessors; Nanostructures; Optical interconnections; Optical materials; Power electronics; Power system interconnection; Rendering (computer graphics); Surface structures; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2010 12th IEEE Intersociety Conference on
Conference_Location
Las Vegas, NV
ISSN
1087-9870
Print_ISBN
978-1-4244-5342-9
Electronic_ISBN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2010.5501343
Filename
5501343
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